SIMULATION STUDY AND MODEL OF FAULT-DETECTION IN COMBINATIONAL CIRCUITS

Authors

  • M. Nawaz Brohi
  • Imran Ujjan

Keywords:

Nonidealtrainsientbehaviour; stuck-at-one, stuck-at-zero.

Abstract

This paper is concerned with the simulated study of faulty combinational circuits and presenting its rectified simulated model in case of detection of any fault by using preset fault-location experiment in C-Language

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Published

1998-06-02

How to Cite

M. Nawaz Brohi, & Imran Ujjan. (1998). SIMULATION STUDY AND MODEL OF FAULT-DETECTION IN COMBINATIONAL CIRCUITS . Sindh University Research Journal - SURJ (Science Series), 30(1). Retrieved from https://sujo.usindh.edu.pk/index.php/SURJ/article/view/7336

Issue

Vol. 30 No. 1 (1998): Sindh University Research Journal (Science Series)

Section

Articles